After finishing his doctorate, Dr. Catlett held appointments as a post-doctoral researcher at the University of Minnesota, an assistant professor of chemistry at Samford University in Birmingham, Alabama, and an adjunct instructor in the School of Ministry at the University of Dallas. Prior to coming to UD, he spent 29 years in the semiconductor industry as a scientist, engineer and manager. Dr. Catlett is an industry-established expert in the chemistry of semiconductor manufacturing, device physics (movement of electrons and holes in silicon), and methods for circuit protection against electrostatic discharge (ESD).
Dr. Catlett is a Benedictine oblate of Subiaco Abbey in Arkansas. In his free time he enjoys fly fishing, golf, and playing Hank Williams songs on his guitar.
B.S. Chemistry and Mathematics, Illinois State University
Ph.D. Physical Chemistry (Physics minor), Indiana University
Master of Theological Studies, University of Dallas
Dr. Catlett teaches Physical Chemistry and Basic Ideas in Chemistry.Chemistry and physics of semiconductor devices, electro-static discharge, and molecular spectroscopy.
Catlett, David L., Jr., Roger A. Cline, and Ponnarith Pok, “ESD Protection for Failsafe and Voltage Tolerant Signals,” in Electrostatic Discharge Protection of Semiconductor Devices and Circuits, J Liou, ed., Boca Raton, Florida: CRC Press, 2015.
Venkataraman, Sunitha, Cynthia Torres, David Catlett, Tim Rost, Chris Barr, and Keith Burgess, “Design Considerations to Reduce Process Sensitivity for Transient‐triggered Active Rail Clamps in Advanced CMOS Technologies,” 2012 International ESD Workshop (IEW), May 2012, Belgium.
Catlett, David L., Jr., “For God So Loved the Cosmos. Science and Theology as Complementary Approaches to Mystery,” Dallas Ministry Conference, Dallas, Texas, October 12, 2018.
Catlett, David L., Jr., “A Pastoral Approach to Dialogue Between Science and Religion,” Dallas Ministry Conference, Dallas, Texas, October 1, 2016.
Venkataraman, Sunitha, Cynthia Torres, David Catlett, Tim Rost, Chris Barr, and Keith Burgess, “Design Considerations to Reduce Process Sensitivity for Transient‐triggered Active Rail Clamps in Advanced CMOS Technologies,” 2012 International ESD Workshop (IEW), May 2012, Belgium.
Catlett, Dave, Sam Shichijo, Steven Zuhoski, Dan Mosher, Kenan Dickerson, Hong Yang, “Process Considerations for Improved “ON” State Reliability of Drain‐Extended MOSFETs,” 2007 Texas Instruments Yield Symposium, Dallas, Texas.